Fundamentals of Convergent Beam Electron Diffraction.
نویسندگان
چکیده
منابع مشابه
Convergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
متن کاملConvergent beam electron diffraction
The development of new materials requires an understanding of their mode of growth and the nature of defects, interfaces and strains thereby incorporated. This paper shows how convergent beam electron diffraction (CBED) and large angle CBED (LACBED) can be used to analyse such problems. It is shown how CBED and LACBED can give two-beam rocking curves, which can be used to profile plane rotation...
متن کاملRecent Advances in Quantitative Convergent Beam Electron Diffraction
Two recent advances in quantitative convergent beam electron diffraction (CBED) developed at the University of Bristol are described in this paper. The first is a new scanning technique in which the diffracted intensities in the resulting pattern are integrated through the Bragg condition, equivalent to precessing the sample around a stationary beam. Many more reflections are excited than in a ...
متن کاملPractical phase identification by convergent beam electron diffraction.
The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by...
متن کاملApplication of convergent-beam electron diffraction to the determination of grain boundary structures
Convergent-beam electron diffraction (CBED) has been applied in grain boundary structure determination, both for horizontal and vertical boundaries in thin specimens. First the relation between bicrystal symmetry and CBED pattern symmetry is developed for the two types of boundaries. These results are subsequently employed for a structure determination of twin boundaries in Au and Si. The CBED ...
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ژورنال
عنوان ژورنال: Nihon Kessho Gakkaishi
سال: 2002
ISSN: 0369-4585,1884-5576
DOI: 10.5940/jcrsj.44.150